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932377A 3mm Ball Probe for Height Gauge or CMM
workpiece height: 115 mm
OPTICAL PATH SET UP FOR WOLLASTONE SQUARENESS MEASUREMENTS – SCHEMATIC FOR FIRST AXIS
A multi-revolution dial indicator suited to general measurement applications
A non-digital Mitutoyo micrometer provided with pointed spindle and anvil to enable measurement within curved
Leitech 403053 Leitech Go-No Go Plug gauge class 2B Size :3/8-16UNC Depth : 1.6" Microscope Accessories 932377A 3mm Ball Probe forLeitech Combi Gauge Inch The Leitech Combi Gauge represents the basic patented idea in The System Leitech the capability of measuring both thread quality and thread depth in one single operation. When the Combi Gauge is screwed in to a thread hole, the scale divided telescope sleeve is pushed up in the handle. The thread depth can then be read directly on the sleeve. The resolution of the scale on Leitech Combi Gauge System is 0. 025". If higher
