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Bowers Time 5100 Portable LEEB Hardness Tester - D Probe Manual Test Stand Measuring Span: 15 mm

SKU 72824924174
4.6
USD880.65 USD926.65

Pay in 4 interest-free payments of $220.16 Learn more

Shipping Estimate
USA
  • USA
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Ships within 48 hours · Estimated delivery Sep 30 - Oct 5

Description

Measuring Span: 15 mm

Composition of Leaves: 51 leaves: Set of 188-122 and 188-111

MarTest 1004Z DTI 4333900

Spare prongs are also available

with RS-232 output of angle data

Bowers Time 5100 Portable LEEB Hardness Tester - D Probe Manual Test Stand Measuring Span: 15 mmTIME 5100 Portable LEEB Hardness Tester D Probe Leeb hardness testing was invented in 1975 in Switzerland and has become one of the most popular portable testing methods currently available. The TIME Leeb Hardness testers are supplied to the industry since 1991 and can be seen as the current global standard for Portable hardness testing. View Product Data Sheet FEATURES Excellent portability for testing anywhere, anytime. Automatic gravity

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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