378-810-3 M Plan Apo SL20X Objective for bright-field observation in visible range, SL Super Long working distance Analogue TIME 5100 Portable LEEB Hardness

TIME 5100 Portable LEEB Hardness Tester - C Probe

Powered by rechargeable battery or AC adapter

In Air: 12

Pointer rotation (inches)

Standard: DIN 863 | DAkkS-Kalibriert nach DIN EN ISO/IEC 17025:2018

378-810-3 M Plan Apo SL20X Objective for bright-field observation in visible range, SL Super Long working distance Analogue TIME 5100 Portable LEEB HardnessFeatures Super Long Working Distances Infintiy Corrected Bright Field Inspection High Qualtiy Plan Apochromat Design Flat Image Surface over Entire Field of View Features Model: M Plan Apo SL 20X Working distance: In Air: 30. 5 mm Corrected Wave Length: 436 656 nm N. A.: 0. 28 f: 10 mm P. D.: 95 mm R: 1 m FOV 1: 1. 2 mm FOV 2: 0,24 x 0,32 mm Abbreviations in product table: N. A.: Numerical aperture W. D.: Working distance P. D.: Parfocal distance f: