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378-814-4 M Plan Apo HR 50X High resolution objective for bright-field observation in visible range Bowers test stands

SKU 99325839954
4.7
USD2572.29 USD2618.29

Pay in 4 interest-free payments of $643.07 Learn more

Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Oct 26 - Oct 31

Description

test stands

the height gauge gives clear indications not only when capturing simple points but it becomes a proven advantage for the determination of the culmination points

Mass: 5400 g

in measuring stations on the machine or in production on machine tools

The Mitutoyo point micrometer with mechanical counter utilizes pointed anvil and spline tips to measure small groves on parts or workpieces along with keyways

378-814-4 M Plan Apo HR 50X High resolution objective for bright-field observation in visible range Bowers test standsHigh Resolution Infinity Corrected Breight Field Inspection High Quality Plan Apochromat Flat Image Surface over Entire Field of View Features Model: M Plan Apo HR 50X Working distance: In Air: 5. 2 mm Corrected Wave Length: 436 656 nm N. A.: 0. 75 f: 4 mm P. D.: 95 mm R: 0. 4 m FOV 1: 0. 48 mm FOV 2: 0,1 x 0,13 mm Abbreviations in product table: N. A.: Numerical aperture W. D.: Working distance P. D.: Parfocal distance f: Focal distance R: Resolving

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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